Controlling the shape, orientation, and linkage of carbon nanotube features with nano affinity templates

Wang et al. 10.1073/pnas.0511022103.

Supporting Figures

Files in this Data Supplement:

Supporting Figure 6
Supporting Figure 7
Supporting Figure 8
Supporting Figure 9
Supporting Figure 10
Supporting Figure 11
Supporting Figure 12

Supporting Figure 6

Fig. 6. AFM tapping mode phase and topographic images of SWNT nanoarcs. Phase image of a 2 × 2 MHA ring array, illustrating that short SWNTs bend to form sub-mm-sized arcs without closing the rings. (Inset) An enlarged topographic image of one of these rings. All images were taken at a scan rate of 0.5 Hz. The height scale is 20 nm, and the phase lag is 25^o.

Supporting Figure 7

Fig. 7. AFM tapping mode topographic images of SWNT letters. (a) Whole array (45 × 45 mm), including the letters S, Z, U, C, N, and L. (b-i) Zoom-in view of individual letters. Note that b and d are the patterned MHA nanoletters before SWNT deposition. All images were taken at a scan rate of 0.5 Hz. The height scale is 20 nm.

Supporting Figure 8

Fig. 8. AFM tapping mode topographic images illustrating the dot size influence for trapping SWNTs. (a) Array of 3 × 3 dots with sizes of 1 mm, 875 nm, 650 nm, 500 nm, 375 nm, 250 nm, 200 nm, 140 nm, and 90 nm. (b-j) Zoom-in views of each individual dot. The height scale is 20 nm. All images were taken at a scan rate of 0.5 Hz.

Supporting Figure 9

Fig. 9. AFM tapping mode topographic images illustrating the line size influence for trapping SWNTs. (a) Array of 3 × 2 lines with sizes of 3 mm × 750 nm, 2.2 mm × 400 nm, 1.5 mm × 250 nm, 875 nm × 150 nm, 450 nm × 120 nm, and 450 nm × 100 nm. (b-g) Zoom-in views of each individual line. All images were taken at a scan rate of 0.5 Hz. The height scale is 20 nm.

Supporting Figure 10

Fig. 10. Affinity of SWNTs to different alkanethiol SAMs formed on gold substrates. (a) MHA. (b) ODT. (c) PEG-SH. (d) AUT. All images were taken at a scan rate of 0.5 Hz. The height scale is 20 nm.

Supporting Figure 11

Fig. 11. SWNTs assembled along MHA line features that were defined by parallel DPN with a 26-pen array.

Supporting Figure 12

Fig. 12. AFM tapping mode topographic (a) and phase (b) images of a SWNT random circuit. Note that this image is a zoom-in view of the array shown in Fig. 4c. The SWNTs precisely position, bend, and link to follow the random path of the MHA line. All images were taken at a scan rate of 0.5 Hz. The height scale in a is 20 nm and 20^o of phase lag in b.